Cellcia™ series is the next generation wafer probing system for 300mm wafers. Wafers are tested in a multi test cell system simultaneously. The testing process involves distributing wafers into the array of test cells to accomplish fast turn-around-time compared to existing prober systems. The multi-layer system structure significantly reduces the test footprint and achieves greater wafer output per square meter than conventional probers. The Cellcia™ series is an innovative test platform, which make total test cost lower.
