The P-12XL prober series is the industry benchmark for 300mm wafer testing. The systems retains TEL's acclaimed On-Axis-Alignment feature of previous models and eliminates probe pin placement errors under both high and low temperature conditions. The P-12XL series probers were designed for reduced pad sizes. Their rigid, deflection resistant stage improves accuracy when handling higher pin counts. The P-12XLm is the flagship of the P-12XL series and is capable of superior alignment performance through enhanced optics capability.

• High pin count MPU
• High multi-DUT memory
• Low-noise parametric probing
• Fine pitch probing

• A high-accuracy and high-force resistance stage for optimal contact
• Hot and cold temperature, heat dissipation thermal systems
• Capable of handling CIM/FA, such as AMHS
• Clean technology
• PC-aided product file management and remote operation
• Software compatibility with the P-8 series
• 300mm, 200mm and 150mm (option) wafer size measurement capable