HOME > Products > Semiconductor Production Equipment

Semiconductor Production Equipment

TEL is the world's second largest manufacturer of semiconductor production equipment. Our diverse product line, used to manufacture chips, is supported with world-class research by TEL employees and productive collaboration with industry consortia, universities, and customers from around the world.

Thermal Processing

Thermal Processing

Vertical thermal processing systems for general oxidation and annealing, deposition, LPCVD, and a variety of other applications.

Coater/Developers

Coater/Developers

Tools used intensively in photolithography to deposit uniform thin films used to define millions of microscopic circuit elements on the surface of silicon.

Etch Systems

Etch Systems

Equipment using high-energy ions from a plasma to remove materials for dual-damascene, poly gate, low-k, self-aligned contact (SAC) and deep trench pattern formation.

Surface Preparation Systems

Surface Preparation Systems

Automated wet and dry chemistry systems used to remove the contaminants from the wafer surface and to prepare the surface for further processing.

Single Wafer Deposition

Single Wafer Deposition

Equipment employing advanced chemical vapor deposition (CVD), oxidation or nitridation technologies to deposit films including tungsten, tungsten silicide, titanium, titanium nitride, and tantalum oxide.

Wafer Probe Systems

Wafer Probe Systems

Equipment providing electrical testing of finished devices on whole or diced wafers or in wafer-level packages.

Material Modification/Doping

Material Modification/Doping

Systems using a directed energetic chemical beam to produce extremely shallow doping, thin film deposition or surface modifications.

Corrective Etching/Trimming

Corrective Etching/Trimming

Systems using programmed processes to compensate for electrical or material variations

Optical Digital Profilometry

Optical Digital Profilometry

High-speed computational platform for both stand-alone and integrated metrology (IM) applications using non-destructive scatterometry-based data to determine device profiles, critical dimensions, and multiple layer film thickness.

New Products Promotion

New Products Promotion

E-beam wafer defect inspection system for a variety of FEOL & BEOL physical and voltage contrast defect applications.

Back to top